青云翻译

We use X-ray photoelectron spectroscopy depth profile analysis of the samples were clearly state FeAu sputtering FePt layer with a relatively flat interface, the interface is no longer clear after annealing, a strong inter-diffusion, can look at this diagram, annealing temperature, diffusion increas

We used x-ray photoelectron can spectrum on samples for has profile control deep analysis, clearly sputtering State FeAu and FePt layer has relative flat of interface, annealing Hou interface is no longer clear, occurred strongly mutual diffusion, may through this diagram view about, annealing tempe

We used X beam photoelectron power spectrum to do to the sample have split the deep analysis, obviously spluttered condition FeAu and the FePt level has the relatively smooth contact surface, after the annealing the contact surface no longer is clear, occurs intensely proliferates mutually, might th

We have adopted a X-ray photoelectron spectroscopy of samples deep analysis, it is clear that the Chinese mentality sputter with FePt FeAu layer is relatively formation interface, the interface is no longer clear, annealing after a strong Internet, can be spread through this diagram, a look at the a

We used x-ray photoelectron can spectrum on samples for has profile control deep analysis, clearly sputtering State FeAu and FePt layer has relative flat of interface, annealing Hou interface is no longer clear, occurred strongly mutual diffusion, may through this diagram view about, annealing tempe